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XEN1220 datasheet update

Posted 03/07/2018

More detailed magnetic matching data has been added to datasheet version 2


 

 

 

 

 

Patents
Patents

MAGNETIC FIELD SENSOR, SUPPORT FOR SUCH A MAGNETIC FIELD SENSOR AND A COMPASS PROVIDED WITH SUCH A MAGNETIC FIELD SENSOR
 

Inventor:

RIEDIJK FRANK ROBERT [NL]
VAN DER MEER JEROEN CHRISTIAAN [NL] (+2)

Applicant:

XENSOR INTEGRATION B V [NL]
RIEDIJK FRANK ROBERT [NL] (+3)

EC:

G01R33/07
G01R33/07A1

IPC:

G01R33/07
(IPC1-7):G01R33/07

Publication info:

WO2005073744 (A1)
2005-08-11

Priority date:

2003-12-19


Fingerprint Sensor Equipment
 

Inventor:

RIEDIJK FRANK R [SE]
HAMMERSBERG JOHAN [SE]

Applicant:

FINGERPRINT CARDS AB [SE]

EC:

G06K9/00A1A

IPC:

G06K9/00

Publication info:

US2008069413 (A1)
2008-03-20
US7864992 (B2)
2011-01-04

Priority date:

2004-06-18


METHOD AND DEVICE FOR DETERMINING A COEFFICIENT OF HEAT TRANSFER FROM A SENSOR ASSEMBLY TO A FLUID
 

Inventor:

VAN DER GRAAF FREDERIK [NL]
VELTHUIS JOHANNES FRANCISCUS M [NL] (+5)

Applicant:

TNO [NL]
VAN DER GRAAF FREDERIK [NL] (+6)

EC:

G01F1/684
G01K17/16

IPC:

G01F1/684
G01K17/16
(IPC1-7):G01F1/68
(+2)

Publication info:

WO02065079 (A1)
2002-08-22

Priority date:

2001-02-12


METHOD AND DEVICE FOR DETERMINING A HEAT FLOW TO A FLUID
 

Inventor:

VAN DER GRAAF FREDERIK [NL]
VELTHUIS JOHANNES FRANCISCUS M [NL] (+5)

Applicant:

TNO [NL]
VAN DER GRAAF FREDERIK [NL] (+6)

EC:

G01F1/684M
G01K17/16

IPC:

G01F1/684
G01K17/16
(IPC1-7):G01F1/68
(+2)

Publication info:

WO02065078 (A1)
2002-08-22

Priority date:

2001-02-12


Sensing device and a method relating thereto
 

Inventor:

HESTNES NJAARD [NO]
RIEDIJK FRANK ROBERT [NL]

Applicant:

FINGERPRINT CARDS AB [SE]

EC:

G01B7/004
G01B7/34
G06K9/00A1A

IPC:

G01B7/004
G01B7/28
G01B7/34
(+3)

Publication info:

US6778686 (B1)
2004-08-17

Priority date:

1998-02-16


Two-line mixed analog/digital bus system and a master station and a slave station for use in such system
 

Inventor:

HUIJSING JOHAN H [NL]
TUK ROELAND F [NL] (+4)

Applicant:

PHILIPS CORP [US]

EC:

G06F13/42C2A
H04J7/00
H04L25/49A

IPC:

G06F13/42
H04J7/00
H04L25/49
(+3)

Publication info:

US5604918 (A)
1997-02-18

Priority date:

1993-06-04


INTEGRATED SEMICONDUCTOR CIRCUIT FOR THERMAL MEASUREMENTS
 

Inventor:

HUIJSING JOHAN H [NL]
RIEDIJK FRANK R [NL]

Applicant:

BRONKHORST HIGH TECH BV [NL]

EC:

G01F1/68
G01F1/696
G01K17/04

IPC:

G01F1/68
G01F1/696
G01F1/698
(+8)

Publication info:

US5064296 (A)
1991-11-12

Priority date:

1989-06-23

 

https://academic.microsoft.com/#/detail/2013637973